VIVO
Index
Log in
Search form
Home
People
Organizations
Research
Events
Capability Map
Application-level fault tolerance in the orbital thermal imaging spectrometer
Conference Paper
http://dx.doi.org/10.1109/prdc.2004.1276551
Overview
Identity
View All
Overview
authors
Ciocca, E.
Koren, I.
Koren, Z.
Krishna, C.M.
Katz, Daniel S
Identity
International Standard Book Number (ISBN) 10
0-7695-2076-6